Region : Jabodetabek BRANCH : ESD 7 NTL : Jakarta Selatan Cluster 2 2G Bad Spot Report 05 June 2013
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
Page 1
2G Bad Spot Executive Summary • •
► Latest Update : Tuesday, September 18, 2013
• ► Finding: 1. Found Low Coverage Problem at 1 Spot 2. Found Bad Quality problem at 2 spot • ► Action : 1. Azimuth adjustment : 0 cells 2. Tilting adjustment : 2 Cells • ► Achievement : 1. Improved bad Low Coverage spot 1 from 1 spot 2. Improved Bad Quality spot 0 from 2 spot
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
Page 2
Cluster 2_METHODOLOGY
2G METHOD CLUSTER MS
Equipment
Band
Method LAPTOP 1 (TEMS 8)
MS1
SE K800i
2G Lock
Idle Mode
MS2
SE K800i
2G Lock
Voice Short call sequence 120s idle 10s (212)
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
Page 3
Cluster 2_Topology Map and Drive test Route
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
Page 4
Cluster 2_Site List and Drive test Route
Area
Cluster 2
Priority
Count Of site
Inner
Jakarta Inner
P1
30
Total Of Site
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
Page 5
30
Cluster 2_Physical Antenna Adjustments Summary EDT Cell Name
Longitude
090466_Pupan_Pondok_Pinang_1
106.7682778
090466_Pupan_Pondok_Pinang_2
106.7682778
090466_Pupan_Pondok_Pinang_3
106.7682778
Latitude
Ant Type
6.28308333 Kathhrein Xpol F-Panel 17103 1990-65 6.28308333 Kathhrein Xpol F-Panel 17103 1990-66 6.28308333 Kathhrein Xpol F-Panel 17103 1990-67
MDT
Azimuth
Height
SDB
Before
After
SDB
Before
After
SDB
Before
After
SDB
Before
After
2
2
2
0
4
4
60
60
60
24.6
26
26
2
2
2
1
4
2
180
190
190
24.6
26
26
2
2
2
0
4
4
300
300
300
24.6
26
26
094228_JL_CIPUTAT_RAYA_1
106.7769799 -6.26039631
Katherin
0
2
2
2
1
1
60
30
30
30
30
30
094228_JL_CIPUTAT_RAYA_2
106.7769799 -6.26039631
Katherin
0
2
2
2
6
4
180
210
210
30
30
30
094228_JL_CIPUTAT_RAYA_3
106.7769799 -6.26039631
Katherin
0
2
2
2
2
2
300
330
330
30
30
30
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
Page 6
Cluster 2_Bad Spot Tracker Cluster
Cluster 2
Cluster 2
Cluster 2
Event ID
Event Type
BC#1
Bad Coverage
BQ#1
Bad Quality
BQ#2
Bad Quality
Problem Type
Coverage
Bad Quality
Bad Quality
Open Date
5-Jun-13
5-Jun-13
5-Jun-13
Root Cause Low Coverage serve from cell 090466_Pupan_Pondok_Pinang_2 (CI: 2204) Due to no dominant serving cell in this area
Action
Solution Category
Need Audit physical antenna changes Uptil for Cell 090466_Pupan_Pondok_Pinang_2 from MDT 4 to 2 and Speed Up On air 94843_MAWAR DALAM (long 106.764 Lat -6.28544)
Physical Tuning and Speed up On air
Adjust parameter Add Neighbor from site 92171_Ulujami Raya Bad Qual on cell 92171_Ulujami Raya due to No to 91650_Bintaro Depsos and before Site 94567_Bintaro Neighbor relation from site 92171_Ulujami Raya to Relocation no on air DT after site 94567_Bintaro Relocation on Parameter Tyuning and Speed up On air 91650_Bintaro Depsos air Bad Qual on cell 100354_H_Kebun-Rengas_2 due to alarm GSM Cell out of service site 100354_H_Kebun- Open TT (1-20130430-0253) Alarm alrady clear and before Rengas_3 280997_Swadaya Bintaro no on air DT after site 280997_Swadaya Bintaro on air Due to no dominant serving cell in this area
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
Alarm and Speed up On air
Page 7
Status
Close Date
Park
18-Sep-13
Close
18-Sep-13
Close
18-Sep-13
Cluster 2_Statistic Before and After Statistic Before KPI”S
Statistic After
212
KPI”S
212
# of Sectors Serving
89
# of Sectors Serving
105
Call Attempt
127
Call Attempt
114
Call Setup
124
Call Setup
113
Call Established
124
Call Established
113
Blocked Call
1
Blocked Call
1
Dropped Call
1
Dropped Call
0
Call Set-Up Success Rate
97.64%
Call Set-Up Success Rate
99.12%
Drop Call Rate
0.81%
Drop Call Rate
0.00%
Average Call Setup Time
2.4395
Average Call Setup Time
2.5704
HOSR
98.21%
HOSR
99.10%
Handover Handover Failure
215 4
Rx Level >= -80 dBm
98.27%
RX Quality <= 5
95.54%
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
Handover
217
Handover Failure
2
Rx Level >= -80 dBm
98.80%
RX Quality <= 5
98.19%
Page 8
Cluster 2_Bad Spot Analysis (RX Level PLOT) RxLev Before
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
RxLev After
Page 9
Cluster 2_Bad Spot Analysis (RX Qual PLOT) RxQual Before
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
RxQual After
Page 10
2G Bad Spot Improvement_Rx Level (BC#1) After
Before
Not OA
Event ID BC#1
Description Low Coverage serve from cell 090466_Pupan_Pondok_Pinang_2 (CI: 2204) Due to no dominant serving cell in this area
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
Action/ Recommendation
Status
Need Audit physical antenna changes Uptil for Cell 090466_Pupan_Pondok_Pinang_2 from MDT 4 to 2 and Speed Up On air 94843_MAWAR DALAM (long 106.764 Lat -6.28544) (Permanen On air)
Page 11
Closed 18-09-2013
2G Bad Spot Improvement_Rx Quality (BC#1) After
Before
Not OA
Event ID BC#1
Description Low Coverage serve from cell 090466_Pupan_Pondok_Pinang_2 (CI: 2204) Due to no dominant serving cell in this area
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
Action/ Recommendation
Status
Need Audit physical antenna changes Uptil for Cell 090466_Pupan_Pondok_Pinang_2 from MDT 4 to 2 and Speed Up Onair 94843_MAWAR DALAM (long 106.764 Lat -6.28544) (Permanen On air)
Page 12
Closed 18-09-2013
2G Bad Spot Improvement_Rx Level (BQ#1) After
Before
Not OA
Event ID BQ#1
Description Bad Qual on cell 92171_Ulujami Raya due to No Neighbor relation from site 92171_Ulujami Raya to 91650_Bintaro Depsos
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
Action/ Recommendation
Status
Adjust parameter Add Neighbor from site 92171_Ulujami Raya to 91650_Bintaro Depsos and before Site 94567_Bintaro Relocation not yet on air , DT after site 94567_Bintaro Relocation on air
Page 13
Closed 18-09-2013
2G Bad Spot Improvement_Rx Quality (BQ#1) After
Before
Not OA
Event ID BQ#1
Description Bad Qual on cell 92171_Ulujami Raya due to No Neighbor relation from site 92171_Ulujami Raya to 91650_Bintaro Depsos
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
Action/ Recommendation
Status
Adjust parameter Add Neighbor from site 92171_Ulujami Raya to 91650_Bintaro Depsos and before Site 94567_Bintaro Relocation not yet on air, DT after site 94567_Bintaro Relocation on air
Page 14
Closed 18-09-2013
2G Bad Spot Improvement_Rx Level (BQ#2) After
Before
Not OA
Event ID BQ#2
Description Bad Qual on cell 100354_H_KebunRengas_2 due to alarm GSM Cell out of service site 100354_H_KebunRengas_3
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
Action/ Recommendation
Status
Open TT (1-20130430-0253) Alarm already clear and before 280997_Swadaya Bintaro not yet on air, DT after site 280997_Swadaya Bintaro on air
Page 15
Closed 18-09-2013
2G Bad Spot Improvement_Rx Quality (BQ#2) After
Before
Not OA
Event ID BQ#2
Description Bad Qual on cell 100354_H_KebunRengas_2 due to alarm GSM Cell out of service site 100354_H_KebunRengas_3
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
Action/ Recommendation
Status
Open TT (1-20130430-0253) Alarm already clear and before 280997_Swadaya Bintaro not yet on air, DT after site 280997_Swadaya Bintaro on air
Page 16
Closed 18-09-2013
Cluster 2_Rx Level and Rx Qual BEFORE - AFTER
Rx Level
Before
Percentage
After
Percentage
0 to -68 dBm
3936
46%
6326
74%
-68 to -72 dBm
1697
20%
956
11%
-72 to -76 dBm
1454
17%
636
7%
-76 to -80 dBm
837
10%
382
4%
-80 to -84 dBm
408
5%
146
2%
-84 to -89 dBm
135
2%
80
1%
-89 to 95 dBm
12
0%
19
0%
-95 to -120 dBm
0
0%
4
0%
Total
8479
100%
8549
100%
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
Rx Quality
Before
Percentage
After
Percentage
0 to 3
83.69%
6651
92.00%
11.85%
447
6.18%
6 to 7
5725 811 305
4.46%
131
1.81%
Total
6841
100%
7229
100%
4 to 5
Page 17
8/20/2013 8/21/2013 8/22/2013 8/23/2013 8/24/2013 8/25/2013 8/26/2013 8/27/2013 8/28/2013 8/29/2013 8/30/2013 8/31/2013 9/1/2013 9/2/2013 9/3/2013 9/24/2013 9/25/2013 9/26/2013 9/27/2013 9/28/2013 9/29/2013
Cluster Performance CS TCH Drop Rate
0.003 0.0025 0.002 0.0015 0.001 0.0005 0
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR Page 18
Cluster Performance PS
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
Page 19
HUAWEI TECHNOLOGIES CO., LTD. HISILICON SEMICONDUCTOR
Page 20